X-ray diffraction is the main method for structural analysis of materials and for the study of their structural quality, due to the unsurpassed precision in the measurement of the crystalline lattice parameters. The X-Ray Diffraction Laboratory is equipped with modern equipment which allows for advanced X-ray diffraction characterization of very different crystalline materials systems.
The Rikagu SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high-resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, a 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
This diffractometer allows for the investigation of the preferred orientation of individual crystallites, and residual stress analysis of powders, polycrystalline materials, and polycrystalline thin films as well as single crystalline films. With this system it is also possible to measure the rocking curves of the samples in the sample-detector decoupled mode and to take diffraction profiles in grazing incidence. In addition it is equipped with an automatic sample changer, a capillary module for small amounts of powdered samples and a hot stage operated in various inert environments (up to 1100°C). Single crystalline structures for microelectronics, optoelectronics, and other functional applications, i.e. the structures which comprise nearly perfect thin films, heterostructures, superlattices, and multilayers are studied by means of a high resolution X-ray diffraction facility at the Wolfson Centre for Interface Science. This facility combines an 18 kW Rigaku rotating anode generator and a Bede D3 high-precision multipurpose goniometer, and is used for the precise measurement of depth-resolved profiles of lattice parameters, influenced by sample composition, point and extended defects, as well as by the interfacial strain fields. X-ray diffraction mapping in reciprocal space allows us to resolve between the in-plane and out-of-plane modifications of crystalline structure.
Another available mode of the system’s operation is glancing angle X-ray reflectivity, which provides information on surface roughness and on electron density variations beneath the surfaces and buried interfaces of various crystalline and non-crystalline materials, including glasses and polymers.
Lab technician: Joshua Schecter, 04-8294566.